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　　為了測試(shi)電(dian)池的(de)性能(neng)指(zhi)標是(shi)否滿足需求，下(xia)面對(dui)鋰電(dian)池的(de)常規(gui)性能(neng)測試(shi)方式做個介(jie)紹(shao)：

　　一、常(chang)規成品測(ce)試；

　　充(chong)(chong)電(dian)(dian)：采用測試系統/DC電(dian)(dian)源對電(dian)(dian)池充(chong)(chong)電(dian)(dian)，采用0.2C恒流(liu)恒壓充(chong)(chong)電(dian)(dian)，直至(zhi)電(dian)(dian)池充(chong)(chong)滿為止；

　　放(fang)(fang)電(dian)：采(cai)用(yong)測試(shi)系統/負載儀(yi)對電(dian)池放(fang)(fang)電(dian)，采(cai)用(yong)0.2C恒流放(fang)(fang)電(dian)，直至(zhi)電(dian)池放(fang)(fang)完為止；

　　內(nei)阻(zu)(zu)(zu)：采用高精度內(nei)阻(zu)(zu)(zu)測試(shi)(shi)儀進行內(nei)阻(zu)(zu)(zu)測試(shi)(shi)，一(yi)定要接(jie)觸(chu)點接(jie)觸(chu)良(liang)好(hao)，才能是準確的阻(zu)(zu)(zu)值(zhi)，電(dian)(dian)池(chi)容(rong)量(liang)越(yue)(yue)大，內(nei)阻(zu)(zu)(zu)越(yue)(yue)小(xiao)(xiao)；反正電(dian)(dian)池(chi)容(rong)量(liang)相(xiang)對(dui)越(yue)(yue)小(xiao)(xiao)，內(nei)阻(zu)(zu)(zu)越(yue)(yue)大；且通常倍率電(dian)(dian)池(chi)內(nei)阻(zu)(zu)(zu)偏小(xiao)(xiao)。

　　過流(liu)：采用電(dian)(dian)池(chi)綜合測(ce)試儀，對(dui)成品電(dian)(dian)池(chi)進行(xing)測(ce)試電(dian)(dian)池(chi)的保(bao)護電(dian)(dian)流(liu)，保(bao)護板能否(fou)起到過大電(dian)(dian)流(liu)保(bao)護作用。

　　短路(lu)：采用(yong)專用(yong)測試儀測試電(dian)(dian)(dian)池(chi)(chi)短路(lu)是否有(you)保護功能，通常(chang)很(hen)多保護板在設計經驗不足(zu)情況下或者(zhe)電(dian)(dian)(dian)池(chi)(chi)容量較(jiao)大(da)情況下電(dian)(dian)(dian)池(chi)(chi)過(guo)不了(le)短路(lu)，一(yi)般有(you)電(dian)(dian)(dian)子工程師廠(chang)家(jia)基(ji)(ji)本能過(guo)的，所以選擇較(jiao)正(zheng)規廠(chang)家(jia)基(ji)(ji)本沒問題，或者(zhe)簡易的采用(yong)正(zheng)負極直接短路(lu)，電(dian)(dian)(dian)池(chi)(chi)是否還有(you)電(dian)(dian)(dian)流輸(shu)出(chu)(chu)，無(wu)電(dian)(dian)(dian)流輸(shu)出(chu)(chu)、斷(duan)開負載，恢復電(dian)(dian)(dian)壓等正(zheng)常(chang)功能，證明電(dian)(dian)(dian)池(chi)(chi)有(you)短路(lu)保護。

　　容量：采用0.2C電(dian)(dian)池(chi)充(chong)電(dian)(dian)放電(dian)(dian)，電(dian)(dian)池(chi)容量達(da)到(dao)標稱容量。

　　二、深度測試；

　　高(gao)溫:采(cai)用0.2C恒(heng)(heng)流恒(heng)(heng)壓充電，充電充滿后放(fang)在恒(heng)(heng)溫箱(xiang)里面，溫度調至65℃擱置4H后，采(cai)用0.2C恒(heng)(heng)流放(fang)電至截(jie)止電壓，看看容(rong)量(liang)能否達到標(biao)稱容(rong)量(liang)的(de)85%以上。

　　低溫：采用0.2C恒(heng)流恒(heng)壓充(chong)電(dian)，充(chong)滿后放在低溫箱(xiang)里面，溫度(du)調至-20℃擱置4H后，采用0.2C恒(heng)流放電(dian)至截止(zhi)電(dian)壓，看看放電(dian)容(rong)量是否達到標(biao)稱(cheng)容(rong)量的60%以上。

　　循環：采(cai)用0.2C在25℃充放電(dian)500次(ci)，容量是否保存80%以上。

　　跌落(luo)：采(cai)用標(biao)準跌落(luo)設(she)備，6個面1米高跌落(luo)測試是否有起火(huo)燃燒等不良反應，正常是無(wu)起火(huo)、無(wu)爆(bao)炸、無(wu)冒煙、無(wu)漏(lou)液。